X-ray photoelectron diffraction study of Cu(111): Multiple scattering investigation
نویسندگان
چکیده
Multiple scattering theory based on a cluster model is used to simulate full-hemispherical X-ray photoelectron diffraction measure ments in order to verify how state of the art multiple scattering simulations are able to reproduce the experiment. This approach applied to the Cu(111) surface for two different photoelectron kinetic energies. Differences and similarities between single and multip scattering are discussed in comparison with experimental results. We find that the present approach gives very good results despite som limitations.
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